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VTS
2007
IEEE
143views Hardware» more  VTS 2007»
14 years 2 months ago
RTL Test Point Insertion to Reduce Delay Test Volume
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
Kedarnath J. Balakrishnan, Lei Fang
VTS
2000
IEEE
167views Hardware» more  VTS 2000»
14 years 28 days ago
Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukher...
DATE
2006
IEEE
108views Hardware» more  DATE 2006»
14 years 2 months ago
Software-friendly HW/SW co-simulation: an industrial case study
This paper proposes a novel HW/SW co-simulation approach that minimizes the impact on software designers. We propose a SystemC-based system that enables the software team to test ...
Juanjo Noguera, Luis Baldez, Narcis Simon, Lluis A...
ISPD
2003
ACM
132views Hardware» more  ISPD 2003»
14 years 1 months ago
Architecture and synthesis for multi-cycle communication
For multi-gigahertz designs in nanometer technologies, data transfers on global interconnects take multiple clock cycles. In this paper, we propose a regular distributed register ...
Jason Cong, Yiping Fan, Xun Yang, Zhiru Zhang
IPPS
2007
IEEE
14 years 2 months ago
Enhancing Portability of HPC Applications across High-end Computing Platforms
Fast hardware turnover in supercomputing centers, stimulated by rapid technological progress, results in high heterogeneity among HPC platforms, and necessitates that applications...
Magdalena Slawiñska, Jaroslaw Slawinski, Da...