980 search results - page 11 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ISSRE
2006
IEEE
14 years 3 months ago
2006
IEEE
BPEL is a language that could express complex concurrent behaviors. This paper presents a novel method of BPEL test case generation, which is based on concurrent path analysis. Th...
ISCAS
1999
IEEE
14 years 1 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
SAC
2008
ACM
13 years 8 months ago
2008
ACM
Model-based testing as a black-box testing technique has grown in importance. The models used represent the relevant features of the system under consideration (SUC), and can also...
DAC
2003
ACM
14 years 2 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
KBSE
2010
IEEE
13 years 7 months ago
2010
IEEE
Software constantly undergoes changes throughout its life cycle, and thereby it evolves. As changes are introduced into a code base, we need to make sure that the effect of the ch...