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    ICTAI
    1994
    IEEE
    119views Artificial Intelligence» more  ICTAI 1994»
    GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
    14 years 21 days ago
    GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
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    Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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    ITC
    1994
    IEEE
    136views Hardware» more  ITC 1994»
    An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
    14 years 21 days ago
    An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
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    Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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    ATS
    2000
    IEEE
    86views Hardware» more  ATS 2000»
    An adjacency-based test pattern generator for low power BIST design
    14 years 1 months ago
    An adjacency-based test pattern generator for low power BIST design
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    Patrick Girard, Loïs Guiller, Christian Landr...
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    ATS
    1998
    IEEE
    106views Hardware» more  ATS 1998»
    A Test Pattern Generation Algorithm Exploiting Behavioral Information
    14 years 1 months ago
    A Test Pattern Generation Algorithm Exploiting Behavioral Information
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    This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
    Silvia Chiusano, Fulvio Corno, Paolo Prinetto
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    SAC
    1997
    ACM
    108views Applied Computing» more  SAC 1997»
    SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
    14 years 22 days ago
    SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
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    Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
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