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    ICTAI
    1994
    IEEE
    119views Artificial Intelligence» more  ICTAI 1994»
    GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
    15 years 9 months ago
    GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
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    Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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    ITC
    1994
    IEEE
    136views Hardware» more  ITC 1994»
    An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
    15 years 9 months ago
    An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
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    Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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    ATS
    2000
    IEEE
    86views Hardware» more  ATS 2000»
    An adjacency-based test pattern generator for low power BIST design
    15 years 10 months ago
    An adjacency-based test pattern generator for low power BIST design
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    Patrick Girard, Loïs Guiller, Christian Landr...
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    ATS
    1998
    IEEE
    106views Hardware» more  ATS 1998»
    A Test Pattern Generation Algorithm Exploiting Behavioral Information
    15 years 10 months ago
    A Test Pattern Generation Algorithm Exploiting Behavioral Information
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    This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
    Silvia Chiusano, Fulvio Corno, Paolo Prinetto
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    SAC
    1997
    ACM
    108views Applied Computing» more  SAC 1997»
    SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
    15 years 9 months ago
    SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
    Download  www.cad.polito.it
    Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
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