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FDTC
2010
Springer
118views Cryptology» more  FDTC 2010»
13 years 7 months ago
Low Cost Built in Self Test for Public Key Crypto Cores
The testability of the cryptographic cores brings in an extra dimension to the process of digital circuits testing
Dusko Karaklajic, Miroslav Knezevic, Ingrid Verbau...
IJNSEC
2010
98views more  IJNSEC 2010»
13 years 4 months ago
A Random Bit Generator Using Chaotic Maps
Chaotic systems have many interesting features such as sensitivity on initial condition and system parameter, ergodicity and mixing properties. In this paper, we exploit these int...
Narendra K. Pareek, Vinod Patidar, Krishan K. Sud
LPAR
2012
Springer
12 years 4 months ago
Smart Testing of Functional Programs in Isabelle
Abstract. We present a novel counterexample generator for the interactive theorem prover Isabelle based on a compiler that synthesizes test data generators for functional programmi...
Lukas Bulwahn
DATE
2010
IEEE
134views Hardware» more  DATE 2010»
14 years 2 months ago
Layout-aware pseudo-functional testing for critical paths considering power supply noise effects
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
Xiao Liu, Yubin Zhang, Feng Yuan, Qiang Xu
TCAD
2010
102views more  TCAD 2010»
13 years 3 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra