980 search results - page 31 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...
ICCD
2002
IEEE
14 years 6 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
VLSID
2005
IEEE
14 years 2 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
ACSD
2003
IEEE
14 years 24 days ago
2003
IEEE
In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously prese...
ATS
2009
IEEE
14 years 4 months ago
2009
IEEE
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...