980 search results - page 44 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
SIGSOFT
2003
ACM
14 years 9 months ago
2003
ACM
This paper presents a novel approach for automated test data generation of imperative programs containing integer, boolean and/or float variables. It extends our previous work to ...
IFIP
2001
Springer
14 years 1 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
CP
2009
Springer
14 years 12 days ago
2009
Springer
Abstract. This paper considers the automatic generation of architectural tests (ATGP), a fundamental problem in processor validation. ATGPs are complex conditional constraint satis...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...