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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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AAAI
2010
13 years 9 months ago
Computing Cost-Optimal Definitely Discriminating Tests
The goal of testing is to discriminate between multiple hypotheses about a system--for example, different fault diagnoses--by applying input patterns and verifying or falsifying t...
Anika Schumann, Jinbo Huang, Martin Sachenbacher
ICECCS
2000
IEEE
106views Hardware» more  ICECCS 2000»
14 years 21 days ago
Evaluation of Three Specification-Based Testing Criteria
This paper compares three specification-based testing criteria using Mathur and Wong's PROBSUBSUMES measure. The three criteria are specification-mutation coverage, full pred...
Aynur Abdurazik, Paul Ammann, Wei Ding 0003, A. Je...
DELTA
2008
IEEE
14 years 3 months ago
Adaptive Diagnostic Pattern Generation for Scan Chains
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
Fei Wang, Yu Hu, Xiaowei Li
SWSTE
2005
IEEE
14 years 2 months ago
A Process-Complete Automatic Acceptance Testing Framework
We present a new automated software acceptance tests framework. The framework is novel in supporting the entire lifecycle and all QA activities, including test maintenance over mu...
David Talby, Ori Nakar, Noam Shmueli, Eli Margolin...
DFT
2003
IEEE
98views VLSI» more  DFT 2003»
14 years 2 months ago
Constrained ATPG for Broadside Transition Testing
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
Xiao Liu, Michael S. Hsiao