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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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DFT
2002
IEEE
127views VLSI» more  DFT 2002»
14 years 2 months ago
A New Functional Fault Model for FPGA Application-Oriented Testing
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo ...
GECCO
2007
Springer
182views Optimization» more  GECCO 2007»
14 years 3 months ago
Generating large-scale neural networks through discovering geometric regularities
Connectivity patterns in biological brains exhibit many repeating motifs. This repetition mirrors inherent geometric regularities in the physical world. For example, stimuli that ...
Jason Gauci, Kenneth O. Stanley
IAJIT
2010
147views more  IAJIT 2010»
13 years 6 months ago
A novel radon-wavelet based OFDM system design and performance under different channel conditions
: Finite Radon Transform mapper has the ability to increase orthogonality of sub-carriers, it is non sensitive to channel parameters variations, and has a small constellation energ...
Abbas Hasan Kattoush
SIGSOFT
2003
ACM
14 years 9 months ago
Regression testing of GUIs
Although graphical user interfaces (GUIs) constitute a large part of the software being developed today and are typically created using rapid prototyping, there are no effective r...
Atif M. Memon, Mary Lou Soffa
DATE
2007
IEEE
86views Hardware» more  DATE 2007»
14 years 3 months ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer