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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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VTS
1996
IEEE
75views Hardware» more  VTS 1996»
14 years 1 months ago
A new test pattern generation method for delay fault testing
S. Cremoux, Christophe Fagot, Patrick Girard, Chri...
TCAD
2002
106views more  TCAD 2002»
13 years 8 months ago
Design of hierarchical cellular automata for on-chip test pattern generator
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...
Biplab K. Sikdar, Niloy Ganguly, Parimal Pal Chaud...
COMPUTER
1999
67views more  COMPUTER 1999»
13 years 9 months ago
Current Directions in Automatic Test-Pattern Generation
Kwang-Ting Cheng, Angela Krstic
FATES
2003
Springer
14 years 2 months ago
JMLAutoTest: A Novel Automated Testing Framework Based on JML and JUnit
Abstract. Writing specifications using Java Modeling Language has been accepted for a long time as a practical approach to increasing the correctness and quality of Java programs. ...
Guoqing Xu, Zongyuang Yang
ICST
2011
IEEE
13 years 28 days ago
Exploiting Common Object Usage in Test Case Generation
—Generated test cases are good at systematically exploring paths and conditions in software. However, generated test cases often do not make sense. We adapt test case generation ...
Gordon Fraser, Andreas Zeller