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VTS
1996
IEEE

A new test pattern generation method for delay fault testing

14 years 4 months ago
A new test pattern generation method for delay fault testing
S. Cremoux, Christophe Fagot, Patrick Girard, Chri
Added 07 Aug 2010
Updated 07 Aug 2010
Type Conference
Year 1996
Where VTS
Authors S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch
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