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33

VTS
1996
IEEE

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A new test pattern generation method for delay fault testing

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A new test pattern generation method for delay fault testing

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S. Cremoux, Christophe Fagot, Patrick Girard, Chri

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Added	07 Aug 2010
Updated	07 Aug 2010
Type	Conference
Year	1996
Where	VTS
Authors	S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch

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