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    VTS
    1996
    IEEE
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    A new test pattern generation method for delay fault testing

    14 years 4 months ago
    A new test pattern generation method for delay fault testing
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    S. Cremoux, Christophe Fagot, Patrick Girard, Chri
    claim paper
    Added 07 Aug 2010
    Updated 07 Aug 2010
    Type Conference
    Year 1996
    Where VTS
    Authors S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch
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