980 search results - page 83 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
EURODAC
1994
IEEE
14 years 1 months ago
1994
IEEE
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...
TSE
1998
13 years 8 months ago
1998
—The main goal of this work is to propose a method to evaluate user interfaces using task models and logs generated from a user test of an application. The method can be incorpor...
PASTE
2010
ACM
14 years 2 months ago
2010
ACM
We present a novel technique that identifies the source compiler of program binaries, an important element of program provenance. Program provenance answers fundamental questions...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...