Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...
—The main goal of this work is to propose a method to evaluate user interfaces using task models and logs generated from a user test of an application. The method can be incorpor...
We present a novel technique that identifies the source compiler of program binaries, an important element of program provenance. Program provenance answers fundamental questions...
Nathan E. Rosenblum, Barton P. Miller, Xiaojin Zhu
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
Dan Adolfsson, Joanna Siew, Erik Jan Marinissen, E...
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...