Sciweavers

980 search results - page 91 / 196
» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
Sort
View
DAC
2002
ACM
14 years 10 months ago
Software-based diagnosis for processors
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
Li Chen, Sujit Dey
DFT
2008
IEEE
120views VLSI» more  DFT 2008»
14 years 3 months ago
Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
Oscar Kuiken, Xiao Zhang, Hans G. Kerkhoff
SRDS
1993
IEEE
14 years 1 months ago
Bayesian Analysis for Fault Location in Homogeneous Distributed Systems
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
Yu Lo Cyrus Chang, Leslie C. Lander, Horng-Shing L...
DAC
2011
ACM
12 years 8 months ago
Extracting behavior and dynamically generated hierarchy from SystemC models
SystemC is a popular modeling language which can be used to specify systems at bstraction level. Currently, SystemC tools can not cope with SystemC models for which the module hie...
Harry Broeders, René van Leuken
BMCBI
2008
128views more  BMCBI 2008»
13 years 9 months ago
Validation of an NSP-based (negative selection pattern) gene family identification strategy
Background: Gene family identification from ESTs can be a valuable resource for analysis of genome evolution but presents unique challenges in organisms for which the entire genom...
Ronald L. Frank, Cyriac Kandoth, Fikret Erç...