980 search results - page 92 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
MASCOTS
2010
13 years 10 months ago
2010
To reduce cloud system resource cost, application consolidation is a must. In this paper, we present a novel patterndriven application consolidation (PAC) system to achieve efficie...
ISMVL
2007
IEEE
14 years 3 months ago
2007
IEEE
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
DAC
2000
ACM
14 years 1 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
GIS
2008
ACM
14 years 10 months ago
2008
ACM
Co-location pattern discovery is to find classes of spatial objects that are frequently located together. For example, if two categories of businesses often locate together, they ...
ISMB
2000
13 years 10 months ago
2000
Mycobacterium tuberculosis (M. tb.) strains differ in the number and locations of a transposon-like insertion sequence known as IS6110. Accurate detection of this sequence can be ...