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» Numerical error analysis in Zernike moments computation
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ENDM
2010
86views more  ENDM 2010»
13 years 7 months ago
Mathematical programming based debugging
Verifying that a piece of software has no bugs means proving that it has certain desired properties, such as an array index not taking values outside certain Abstract interpretati...
Leo Liberti, Stéphane Le Roux, Jeremy Lecon...
VLSID
2002
IEEE
124views VLSI» more  VLSID 2002»
14 years 8 months ago
Efficient Approximate Balanced Truncation of General Large-Scale RLC Systems via Krylov Methods
We present an efficient implementation of an approximate balanced truncation model reduction technique for general large-scale RLC systems, described by a statespace model where t...
Q. Su, Venkataramanan Balakrishnan, Cheng-Kok Koh
BMCBI
2010
99views more  BMCBI 2010»
13 years 7 months ago
Different effects of the probe summarization algorithms PLIER and RMA on high-level analysis of Affymetrix exon arrays
Background: Alternative splicing is an important mechanism that increases protein diversity and functionality in higher eukaryotes. Affymetrix exon arrays are a commercialized pla...
Yi Qu, Fei He, Yuchen Chen
SIGMETRICS
2008
ACM
161views Hardware» more  SIGMETRICS 2008»
13 years 7 months ago
Bound analysis of closed queueing networks with workload burstiness
Burstiness and temporal dependence in service processes are often found in multi-tier architectures and storage devices and must be captured accurately in capacity planning models...
Giuliano Casale, Ningfang Mi, Evgenia Smirni
DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu