We present a framework that provides concurrency-enhanced versions of the GOF object-oriented design patterns. The main benefit of our work is that if programmers improve program...
Sean L. Mooney, Hridesh Rajan, Steven M. Kautz, Wa...
Abstract Architectural patterns are often combined with other, relevant architectural patterns during software architecture design. However, combining patterns effectively remains ...
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
– We describe in detail the behavior of an inhibitory Central Pattern Generator (CPG) network for robot control. A four-neuron, mutual inhibitory network forms the basic coordina...
M. Anthony Lewis, Francesco Tenore, Ralph Etienne-...