3385 search results - page 72 / 677 » Observer-Conditioned-Observable Design Pattern |
ISCAS
1999
IEEE
14 years 1 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
SLIP
2009
ACM
14 years 3 months ago
2009
ACM
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
ICPR
2006
IEEE
14 years 2 months ago
2006
IEEE
In this paper, we originally propose a multiscale feature extraction method of finger-vein patterns based on curvelets and local interconnection structure neural networks. The cur...
EWSN
2006
Springer
14 years 8 months ago
2006
Springer
For the proper design of energy-efficient error control schemes some insight into channel error patterns is needed. This paper presents bit error and packet loss measurements taken...
AUTOID
2005
IEEE
14 years 2 months ago
2005
IEEE
In this paper, we analyze impedance matching concepts in passive radio frequency identification (RFID) transponders, which are powered by the incoming RF energy and consist of an...