584 search results - page 4 / 117 » On Applying Set Covering Models to Test Set Compaction |
JMIV
2007
13 years 7 months ago
2007
We discuss the existence of viscosity solutions for a class of anisotropic level-set methods which can be seen as an extension of the mean-curvature motion with a nonlinear anisot...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
CORR
2008
Springer
13 years 7 months ago
2008
Springer
We consider graph properties that can be checked from labels, i.e., bit sequences, of logarithmic length attached to vertices. We prove that there exists such a labeling for check...
ISSRE
2007
IEEE
13 years 9 months ago
2007
IEEE
Model-checkers are powerful tools that can find individual traces through models to satisfy desired properties. These traces provide solutions to a number of problems. Instead of...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...