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» On Applying Set Covering Models to Test Set Compaction
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SAC
2008
ACM
13 years 7 months ago
Test generation and minimization with "basic" statecharts
Model-based testing as a black-box testing technique has grown in importance. The models used represent the relevant features of the system under consideration (SUC), and can also...
Fevzi Belli, Axel Hollmann
JISE
2000
68views more  JISE 2000»
13 years 7 months ago
Testable Path Delay Fault Cover for Sequential Circuits
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
Angela Krstic, Srimat T. Chakradhar, Kwang-Ting Ch...
TOOLS
2000
IEEE
13 years 12 months ago
Testing-for-Trust: The Genetic Selection Model Applied to Component Qualification
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
Benoit Baudry, Vu Le Hanh, Yves Le Traon
EURODAC
1994
IEEE
148views VHDL» more  EURODAC 1994»
13 years 11 months ago
BiTeS: a BDD based test pattern generator for strong robust path delay faults
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
Rolf Drechsler
LWA
2004
13 years 8 months ago
Modeling Rule Precision
This paper reports first results of an empirical study of the precision of classification rules on an independent test set. We generated a large number of rules using a general co...
Johannes Fürnkranz