41 search results - page 4 / 9 » On Detecting Bridges Causing Timing Failures |
WCET
2007
13 years 8 months ago
2007
Memory corruption is one of the most common software failures. For sequential software and multitasking software with synchronized data accesses, it has been shown that program fa...
DATE
2010
IEEE
14 years 13 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
DSN
2003
IEEE
14 years 19 days ago
2003
IEEE
Arbitrary faults of a single node in a time-triggered architecture (TTA) bus topology system may cause error propagation to correct nodes and may lead to inconsistent system state...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...