372 search results - page 29 / 75 » On Fault Testing for Reversible Circuits |
TCAD
2008
13 years 8 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ITC
2002
IEEE
14 years 1 months ago
2002
IEEE
This paper develops a novel approach for formally verifying both safety and liveness properties of designs using sequential ATPG tools. The properties are automatically mapped int...
VLSID
2005
IEEE
14 years 9 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
DSD
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...