1187 search results - page 107 / 238 » On Modeling Cross-Talk Faults |
HASE
1997
IEEE
14 years 1 months ago
1997
IEEE
Fault-tolerant behavior is an important non-functional requirement for systems that involve high criticality. We present a framework which allows the analysis of faulttolerant beh...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
DAC
2006
ACM
13 years 11 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
ICCAD
2007
IEEE
14 years 5 months ago
2007
IEEE
This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature R...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
—Measuring the steady state leakage current (IDDQ) is very successful in detecting faults not discovered by standard fault models. But vector dependencies of IDDQ decrease the re...