1187 search results - page 151 / 238 » On Modeling Cross-Talk Faults |
EVOW
2001
Springer
14 years 1 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in ...
KR
2004
Springer
14 years 2 months ago
2004
Springer
We describe a technique for speeding up inference for model-based abduction tasks that trades off inference time and/or space for the fraction of queries correctly answered. We co...