As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...
Time redundancy (rollback-recovery) and hardware redundancy are commonly used in real-time systems to achieve fault tolerance. From an energy consumption point of view, time redun...
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
The general problem of verifying coherence for shared-memory multiprocessor executions is NP-Complete. Verifying memory consistency models is therefore NP-Hard, because memory con...
In MDE, model transformations should be efficiently tested so that it may be used and reused safely. Mutation analysis is an efficient technique to evaluate the quality of test dat...