1187 search results - page 158 / 238 » On Modeling Cross-Talk Faults |
HPCA
2006
IEEE
14 years 9 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
CODES
2009
IEEE
14 years 3 months ago
2009
IEEE
Time redundancy (rollback-recovery) and hardware redundancy are commonly used in real-time systems to achieve fault tolerance. From an energy consumption point of view, time redun...
ISCA
2005
IEEE
14 years 2 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
SPAA
2003
ACM
14 years 2 months ago
2003
ACM
The general problem of verifying coherence for shared-memory multiprocessor executions is NP-Complete. Verifying memory consistency models is therefore NP-Hard, because memory con...
ECMDAFA
2006
Springer
14 years 14 days ago
2006
Springer
In MDE, model transformations should be efficiently tested so that it may be used and reused safely. Mutation analysis is an efficient technique to evaluate the quality of test dat...