1187 search results - page 20 / 238 » On Modeling Cross-Talk Faults |
GLVLSI
2002
IEEE
14 years 1 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
COMPSAC
2011
IEEE
12 years 8 months ago
2011
IEEE
Abstract—Statistical fault localization techniques find suspicious faulty program entities in programs by comparing passed and failed executions. Existing studies show that such ...
IOLTS
2006
IEEE
14 years 2 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
VTS
1996
IEEE
14 years 23 days ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
ETS
2006
IEEE
14 years 2 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...