1187 search results - page 210 / 238 » On Modeling Cross-Talk Faults |
VLSID
2004
IEEE
14 years 9 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
OSDI
2008
ACM
14 years 9 months ago
2008
ACM
Deadlock is an increasingly pressing concern as the multicore revolution forces parallel programming upon the average programmer. Existing approaches to deadlock impose onerous bu...
ICSE
2003
IEEE-ACM
14 years 8 months ago
2003
IEEE-ACM
Recent evidences indicate that most faults in software systems are found in only a few of a system's components [1]. The early identification of these components allows an or...
ICSE
2007
IEEE-ACM
14 years 8 months ago
2007
IEEE-ACM
Abstract. In this chapter we discuss the susceptibility of critical information infrastructures to computer-borne attacks and faults, mainly due to their largely computerized natur...
ICCD
2006
IEEE
14 years 5 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...