The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
Deadlock is an increasingly pressing concern as the multicore revolution forces parallel programming upon the average programmer. Existing approaches to deadlock impose onerous bu...
Recent evidences indicate that most faults in software systems are found in only a few of a system's components [1]. The early identification of these components allows an or...
T. Wang, Ahmed E. Hassan, Ajith Guedem, Walid Abde...
Abstract. In this chapter we discuss the susceptibility of critical information infrastructures to computer-borne attacks and faults, mainly due to their largely computerized natur...
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...