1187 search results - page 60 / 238 » On Modeling Cross-Talk Faults |
ICC
2007
IEEE
14 years 3 months ago
2007
IEEE
In this paper we investigate the fault diagnosis problem in IP networks. We provide a lower bound on the average number of probes per edge using variational inference technique pro...
ASPDAC
2001
ACM
14 years 11 days ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
VLSID
2005
IEEE
2005
IEEE
Formal Methods for Analyzing the Completeness of an Assertion Suite against a High-Level Fault Model
14 years 2 months ago
One of the emerging challenges in formal property verification (FPV) technology is the problem of deciding whether sufficient properties have been written to cover the design in...
QSIC
2005
IEEE
14 years 2 months ago
2005
IEEE
Database application programs typically contain program units that use SQL statements to manipulate records in database instances. Testing the correctness of data manipulation by ...
FPL
2005
Springer
14 years 2 months ago
2005
Springer
This paper presents a revised model for the yield analysis of FPGA interconnect layers. Based on proven yield models, this work improves the predictions and assumptions of previous...