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ITC
2002
IEEE
114views Hardware» more  ITC 2002»
15 years 9 months ago
Scan Power Reduction Through Test Data Transition Frequency Analysis
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
VLSID
2002
IEEE
97views VLSI» more  VLSID 2002»
15 years 9 months ago
Power Supply Noise Aware Floorplanning and Decoupling Capacitance Placement
Power supply noise is a strong function of the switching activities of the circuit modules. Peak power supply noise can be significantly reduced by judiciously arranging the modu...
Shiyou Zhao, Kaushik Roy, Cheng-Kok Koh
SIGECOM
2010
ACM
152views ECommerce» more  SIGECOM 2010»
15 years 9 months ago
Information aggregation in smooth markets
Recent years have seen extensive investigation of the information aggregation properties of prediction markets. However, relatively little is known about conditions under which a ...
Krishnamurthy Iyer, Ramesh Johari, Ciamac Cyrus Mo...
150
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DCOSS
2010
Springer
15 years 9 months ago
ZeroCal: Automatic MAC Protocol Calibration
Sensor network MAC protocols are typically configured for an intended deployment scenario once and for all at compile time. This approach, however, leads to suboptimal performance...
Andreas Meier, Matthias Woehrle, Marco Zimmerling,...
DCOSS
2010
Springer
15 years 9 months ago
Stateful Mobile Modules for Sensor Networks
Most sensor network applications are dominated by the acquisition of sensor values. Due to energy limitations and high energy costs of communication, in-network processing has been...
Moritz Strübe, Rüdiger Kapitza, Klaus St...
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