The advances in wireless communication and decreasing costs of mobile devices have enabled users to access desired information at any time. Coupled with positioning technologies l...
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
Exponentially rising cooling/packaging costs due to high power density call for architectural and software-level thermal management. Dynamic thermal management (DTM) techniques co...
Abstract-- In nanometer-scale VLSI technologies, several interconnect issues like routing congestion and interconnect delay have become the main concerns in placement. However, all...
Just-in-time (JIT) compilation has previously been used in many applications to enable standard software binaries to execute on different underlying processor architectures. Howev...