867 search results - page 61 / 174 » On Optimization of Test Parallelization with Constraints |
ACRI
2006
Springer
14 years 3 months ago
2006
Springer
The goal of our investigation is to find automatically the absolutely best rule for a moving creature in a cellular field. The task of the creature is to visit all empty cells wi...
ICCAD
2009
IEEE
13 years 6 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
IEEEPACT
2002
IEEE
14 years 1 months ago
2002
IEEE
Modern embedded systems often require high degrees of instruction-level parallelism (ILP) within strict constraints on power consumption and chip cost. Unfortunately, a high-perfo...
COCOA
2010
Springer
13 years 7 months ago
2010
Springer
The classical and well-studied group testing problem is to find d defectives in a set of n elements by group tests, which tell us for any chosen subset whether it contains defectiv...
ICN
2005
Springer
14 years 2 months ago
2005
Springer
Abstract. This paper considers the primary and secondary path generation problem in traffic engineering. We first present a standard MILP model. Since its size and integrality gap...