867 search results - page 8 / 174 » On Optimization of Test Parallelization with Constraints |
COCO
2007
Springer
14 years 1 months ago
2007
Springer
We study a model of graph related formulae that we call the Constraint-Graph model. A constraintgraph is a labeled multi-graph (a graph where loops and parallel edges are allowed)...
VR
2002
IEEE
14 years 16 days ago
2002
IEEE
In this paper, we introduce DLoVe, a new paradigm for designing and implementing distributed and nondistributed virtual reality applications, using one-way constraints. DLoVe allo...
VLSID
1997
IEEE
13 years 11 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
ENC
2003
IEEE
14 years 28 days ago
2003
IEEE
This paper presents the main multiobjective optimization concepts that have been used in evolutionary algorithms to handle constraints in global optimization problems. A review of...