125 search results - page 13 / 25 » On Outage and Error Rate Analysis of the Ordered V-BLAST |
ASPLOS
2010
ACM
13 years 10 months ago
2010
ACM
Online program monitoring is an effective technique for detecting bugs and security attacks in running applications. Extending these tools to monitor parallel programs is challeng...
DSN
2004
IEEE
13 years 11 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
ISPASS
2005
IEEE
14 years 29 days ago
2005
IEEE
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of microprocessor-based systems. In this paper, we present a new method to accurate...
ISCAS
2003
IEEE
14 years 20 days ago
2003
IEEE
Tunneling based random-access memories (TRAM’s) have recently garnered a great amount of interests among the memory designers due to their intrinsic merits such as reduced power...
VTC
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— We analyze the performance of multiple-input multiple-output (MIMO) systems employing orthogonal space-time block codes (STBC) in general Nakagami-m fading channels wit...