247 search results - page 33 / 50 » On Pseudorandom Generators in NC |
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
CARDIS
2008
Springer
13 years 9 months ago
2008
Springer
The mifare Classic is the most widely used contactless smart card in the market. Its design and implementation details are kept secret by its manufacturer. This paper studies the a...
COMPSEC
2004
13 years 7 months ago
2004
Abstract Up to now biometric methods have been used in cryptography for authentication purposes. In this paper we propose to use biological data for generating sequences of random ...
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
IFIP
2001
Springer
13 years 12 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...