60 search results - page 7 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
EMSOFT
2005
Springer
14 years 1 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
ICCD
1999
IEEE
13 years 11 months ago
1999
IEEE
With the reducing distances between wires in deep submicron technologies, coupling capacitances are becoming significant as their magnitude becomes comparable to the area capacita...
ECRTS
2007
IEEE
14 years 1 months ago
2007
IEEE
Today’s CPUs consume a significant amount of power and generate a high amount of heat, requiring an active cooling system to support reliable operations. In case of cooling sys...
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...