60 search results - page 8 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
IOLTS
2006
IEEE
14 years 1 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
DFT
2007
IEEE
14 years 1 months ago
2007
IEEE
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...
ISCAS
2003
IEEE
14 years 23 days ago
2003
IEEE
Tunneling based random-access memories (TRAM’s) have recently garnered a great amount of interests among the memory designers due to their intrinsic merits such as reduced power...
SIGCOMM
2009
ACM
14 years 2 months ago
2009
ACM
This paper presents SoftRate, a wireless bit rate adaptation protocol that is responsive to rapidly varying channel conditions. Unlike previous work that uses either frame recepti...