38 search results - page 3 / 8 » On Reducing Test Data Volume and Test Application Time for M... |
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
VTS
2003
IEEE
14 years 24 days ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...