38 search results - page 8 / 8 » On Reducing Test Data Volume and Test Application Time for M... |
VLSID
2001
IEEE
14 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
DAS
2006
Springer
13 years 10 months ago
2006
Springer
Abstract. Automatic identification of a script in a given document image facilitates many important applications such as automatic archiving of multilingual documents, searching on...
DAC
2005
ACM
14 years 7 months ago
2005
ACM
As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...