82 search results - page 12 / 17 » On Structural vs. Functional Testing for Delay Faults |
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
EICS
2010
ACM
13 years 5 months ago
2010
ACM
We propose an automated routine for hierarchical menu structure optimization. A computer advice-giving system founded on the mathematical model of menu navigation directs the desi...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
— To ensure security and robustness of the next generation of Physically Unclonable Functions (PUFs), we have developed a new methodology for PUF design. Our approach employs int...
LREC
2008
13 years 9 months ago
2008
We report the results of an experiment to assess the ability of automated MT evaluation metrics to remain sensitive to variations in MT quality as the average quality of the compa...