82 search results - page 13 / 17 » On Structural vs. Functional Testing for Delay Faults |
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
The paper presents a synthesis approach for pipelinelike controller structures. These structures allow to implement a built-in self-test in two sessions without any extra test reg...
DATE
2000
IEEE
14 years 1 days ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
SEDE
2007
13 years 9 months ago
2007
— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...
TVLSI
2002
13 years 7 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
DATE
2002
IEEE
14 years 17 days ago
2002
IEEE
Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning tech...