1529 search results - page 126 / 306 » On Timing Analysis of Combinational Circuits |
DAC
2000
ACM
14 years 9 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...
ISQED
2008
IEEE
14 years 2 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
AMAST
2008
Springer
13 years 10 months ago
2008
Springer
Many complex analysis problems can be most clearly and easily specified as logic rules and queries, where rules specify how given facts can be combined to infer new facts, and quer...
ICSE
2010
IEEE-ACM
14 years 1 months ago
2010
IEEE-ACM
Change impact analysis aims at identifying software artifacts being affected by a change. In the past, this problem has been addressed by approaches relying on static, dynamic, a...
DISOPT
2007
13 years 8 months ago
2007
The class Max (r, 2)-CSP (or simply Max 2-CSP) consists of constraint satisfaction problems with at most two r-valued variables per clause. For instances with n variables and m bin...