3718 search results - page 681 / 744 » On learning with dissimilarity functions |
VLSID
2010
IEEE
13 years 6 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
EXACT
2009
13 years 5 months ago
2009
Across many fields involving complex computing, software systems are being augmented with workflow logging functionality. The log data can be effectively organized using declarativ...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
The lack of good "correlation" between pre-silicon simulated delays and measured delays on silicon (silicon data) has spurred efforts on so-called silicon debug. The ide...
ICCV
2009
IEEE
13 years 5 months ago
2009
IEEE
This paper examines the problem of moving object detection. More precisely, it addresses the difficult scenarios where background scene textures in the video might change over tim...
ICDM
2009
IEEE
13 years 5 months ago
2009
IEEE
Traditional machine learning algorithms assume that data are exact or precise. However, this assumption may not hold in some situations because of data uncertainty arising from mea...