305 search results - page 31 / 61 » On modeling top-down VLSI design |
VLSID
2005
IEEE
14 years 1 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
In this paper, we consider the problem of maximizing the battery life (or duration of service) in battery-powered CMOS circuits. We first show that the battery efficiency (or utili...
VLSID
1999
IEEE
13 years 11 months ago
1999
IEEE
Recently Lillis, et al. presented an elegant dynamic programming approach to RC interconnect delay optimization through driver sizing, repeater insertion, and, wire sizing which e...
RECONFIG
2008
IEEE
14 years 1 months ago
2008
IEEE
In the context of the emergence of alternative computing resources to address the challenge of the upcoming end of Moore’s law, we consider the feasibility of gathering computat...
DFT
1999
IEEE
13 years 12 months ago
1999
IEEE
Fault identification capabilities are becoming increasingly important in modern designs, not only in support of design debugging methodologies, but also for the purpose of process...