418 search results - page 20 / 84 » On the Adders with Minimum Tests |
ISVLSI
2003
IEEE
14 years 29 days ago
2003
IEEE
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
FATES
2004
Springer
14 years 1 months ago
2004
Springer
This paper presents a method for reducing the cost of test generation. A spanning set for a coverage criterion is a set of entities such that exercising every entity in the spannin...
ITC
2000
IEEE
14 years 2 days ago
2000
IEEE
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
ICASSP
2010
IEEE
13 years 7 months ago
2010
IEEE
This paper proposes a new statistical model-based likelihood ratio test (LRT) VAD to obtain reliable speech / non-speech decisions. In the proposed method, the likelihood ratio (L...
TIT
2002
13 years 7 months ago
2002
We consider the problem of binary hypothesis testing using binary decisions from independent and identically distributed (i.i.d). sensors. Identical likelihood-ratio quantizers wit...