418 search results - page 3 / 84 » On the Adders with Minimum Tests |
ASYNC
2005
IEEE
14 years 1 months ago
2005
IEEE
We present two novel asynchronous control circuits for domino pipelines. The control circuits are based on GasP circuits, have a minimum cycle time of six gate delays, and compare...
ET
1998
13 years 7 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Testing embedded cores in a System-on-a-chip necessitates the use of a Test Access Mechanism, which provides for transportation of the test data between the chip and the core I/Os...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Structural testing techniques, such as statement and branch coverage, play an important role in improving dependability of software systems. However, finding a set of tests which...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...