1795 search results - page 119 / 359 » On the Complexity of Circuit Satisfiability |
133
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DDECS
2008
IEEE
15 years 7 months ago
2008
IEEE
Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling te...
160
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ICCAD
2010
IEEE
15 years 4 months ago
2010
IEEE
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...
133
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SWAT
1998
Springer
15 years 10 months ago
1998
Springer
We study the complexity of the motion planning problem for a bounded-reach robot in the situation where the n obstacles in its workspace satisfy two of the realistic models propos...
130
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IPL
2008
15 years 6 months ago
2008
We extend Lutz's resource-bounded measure to probabilistic classes, and obtain notions of resource-bounded measure on probabilistic complexity classes such as BPE and BPEXP. ...
155
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SIGCOMM
2010
ACM
15 years 6 months ago
2010
ACM
Data-intensive applications that operate on large volumes of data have motivated a fresh look at the design of data center networks. The first wave of proposals focused on designi...