Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling te...
Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji ...
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...
We study the complexity of the motion planning problem for a bounded-reach robot in the situation where the n obstacles in its workspace satisfy two of the realistic models propos...
Mark de Berg, Matthew J. Katz, Mark H. Overmars, A...
We extend Lutz's resource-bounded measure to probabilistic classes, and obtain notions of resource-bounded measure on probabilistic complexity classes such as BPE and BPEXP. ...
Data-intensive applications that operate on large volumes of data have motivated a fresh look at the design of data center networks. The first wave of proposals focused on designi...
Guohui Wang, David G. Andersen, Michael Kaminsky, ...