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» On the Complexity of Circuit Satisfiability
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DATE
2004
IEEE
131views Hardware» more  DATE 2004»
15 years 10 months ago
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Anuja Sehgal, Krishnendu Chakrabarty
DAC
1997
ACM
15 years 9 months ago
SPIE: Sparse Partial Inductance Extraction
Extracting the inductance of complex interconnect topologies is a formidable task, and simulating the resulting dense partial inductance matrix is even more difficult. Furthermore...
Zhijiang He, Mustafa Celik, Lawrence T. Pileggi
PARLE
1987
15 years 9 months ago
Emulating Digital Logic using Transputer Networks (very High Parallelism = Simplicity = Performance)
Modern VLSI technology has changed the economic rules by which the balance between processing power, memory and communications is decided in computing systems. This will have a pr...
Peter H. Welch
DAC
2010
ACM
15 years 9 months ago
Post-silicon validation opportunities, challenges and recent advances
Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and ...
Subhasish Mitra, Sanjit A. Seshia, Nicola Nicolici
APPROX
2008
Springer
88views Algorithms» more  APPROX 2008»
15 years 8 months ago
Limitations of Hardness vs. Randomness under Uniform Reductions
We consider (uniform) reductions from computing a function f to the task of distinguishing the output of some pseudorandom generator G from uniform. Impagliazzo and Wigderson [IW]...
Dan Gutfreund, Salil P. Vadhan