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» On the Complexity of Circuit Satisfiability
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VLSISP
2010
140views more  VLSISP 2010»
13 years 8 months ago
A Split-Decoding Message Passing Algorithm for Low Density Parity Check Decoders
A Split decoding algorithm is proposed which divides each row of the parity check matrix into two or multiple nearly-independent simplified partitions. The proposed method signific...
Tinoosh Mohsenin, Bevan M. Baas
ICCAD
2009
IEEE
136views Hardware» more  ICCAD 2009»
13 years 7 months ago
Multi-functional interconnect co-optimization for fast and reliable 3D stacked ICs
Heat removal and power delivery have become two major reliability concerns in 3D stacked IC technology. For thermal problem, two possible solutions exist: thermal-through-silicon-...
Young-Joon Lee, Rohan Goel, Sung Kyu Lim
SIAMCOMP
2011
13 years 4 months ago
The Chow Parameters Problem
Abstract. In the 2nd Annual FOCS (1961), Chao-Kong Chow proved that every Boolean threshold function is uniquely determined by its degree-0 and degree-1 Fourier coefficients. These...
Ryan O'Donnell, Rocco A. Servedio
ACMIDC
2011
13 years 1 months ago
LightUp: a low-cost, multi-age toolkit for learning and prototyping electronics
LightUp is a constructionist platform to teach novices about electronics, and also a low-cost rapid-prototyping platform for more advanced users. The LightUp kit contains many bas...
Zain Asgar, Joshua Chan, Chang Liu, Paulo Blikstei...
ISCA
2012
IEEE
281views Hardware» more  ISCA 2012»
12 years 8 days ago
LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems
Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
Aniruddha N. Udipi, Naveen Muralimanohar, Rajeev B...