1795 search results - page 49 / 359 » On the Complexity of Circuit Satisfiability |
ICALP
2009
Springer
14 years 9 months ago
2009
Springer
Negation-limited circuits have been studied as a circuit model between general circuits and monotone circuits. In this paper, we consider limiting negations in formulas. The minimu...
ATS
2005
IEEE
14 years 2 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
ISCAS
1999
IEEE
14 years 1 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
FMSD
2010
13 years 7 months ago
2010
Abstract Modeling and Simulation Aided Verification of Analog/MixedSignal Circuits S. Little and C. Myers (University of Utah, USA) Monday, July 14, 14:00-17:00 4 14:00-14:40 fSpic...
CAMP
2005
IEEE
14 years 2 months ago
2005
IEEE
Abstract— The promise of next-generation computer technologies, such as nano-electronics, implies a number of serious alterations to the design flow of digital circuits. One of ...