1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
Silvia Chiusano, Paolo Prinetto, Hans-Joachim Wund...
Many code analysis techniques for optimization, debugging, or parallelization need to perform runtime disambiguation of sets of addresses. Such operations can be supported efficie...
James Tuck, Wonsun Ahn, Luis Ceze, Josep Torrellas
Estimating planar projective transform (homography) from a pair of images is a classical problem in computer vision. In this paper, we propose a novel algorithm for direct register...
Increased integration in the form of multiple processor cores on a single die, relatively constant die sizes, shrinking power envelopes, and emerging applications create a new cha...
Srikanth T. Srinivasan, Ravi Rajwar, Haitham Akkar...
Most microprocessor chips today use an out-of-order instruction execution mechanism. This mechanism allows superscalar processors to extract reasonably high levels of instruction ...