Sciweavers

953 search results - page 187 / 191
» On the Emulation of Software Faults by Software Fault Inject...
Sort
View
IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
14 years 1 months ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
ISCA
2006
IEEE
133views Hardware» more  ISCA 2006»
14 years 1 months ago
TRAP-Array: A Disk Array Architecture Providing Timely Recovery to Any Point-in-time
RAID architectures have been used for more than two decades to recover data upon disk failures. Disk failure is just one of the many causes of damaged data. Data can be damaged by...
Qing Yang, Weijun Xiao, Jin Ren
TAICPART
2006
IEEE
144views Education» more  TAICPART 2006»
14 years 1 months ago
Testing the Implementation of Business Rules Using Intensional Database Tests
One of the key roles of any information system is to enforce the business rules and policies set by the owning organisation. As for any important functionality, it is necessary to...
David Willmor, Suzanne M. Embury
CASES
2006
ACM
14 years 1 months ago
Mitigating soft error failures for multimedia applications by selective data protection
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
Kyoungwoo Lee, Aviral Shrivastava, Ilya Issenin, N...
ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
14 years 1 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...