Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
RAID architectures have been used for more than two decades to recover data upon disk failures. Disk failure is just one of the many causes of damaged data. Data can be damaged by...
One of the key roles of any information system is to enforce the business rules and policies set by the owning organisation. As for any important functionality, it is necessary to...
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...